ISSN Online: 2377-424X
International Heat Transfer Conference 12
Nanosystems
Table of Contents:
Interferometric Imaging System for Measuring Out-of-Plane Deflection in MEMS Devices
6 pages
DOI: 10.1615/IHTC12.3920
Impact of the material properties on the coupling thermal and electrical analysis of semiconductor devices
6 pages
DOI: 10.1615/IHTC12.3940
Development of Scanning Thermal Microscopy for Nano-scale Real Temperature Measurement
6 pages
DOI: 10.1615/IHTC12.3950
Experimental investigation of femtosecond laser-induced ultra-fast phase-change in crystalline silicon
6 pages
DOI: 10.1615/IHTC12.3960