Доступ предоставлен для: Guest

ISSN Online: 2377-424X

ISBN Print: 978-1-56700-474-8

ISBN Online: 978-1-56700-473-1

International Heat Transfer Conference 16
August, 10-15, 2018, Beijing, China

INTERLAYER THERMAL BOUNDARY RESISTANCE OF WSe2 INVESTIGATED BY USING TIME-DOMAIN THERMOREFLECTANCE MEASUREMENT

Get access (open in a dialog) DOI: 10.1615/IHTC16.nmt.023785
pages 7265-7271

Аннотация

Thermal transport phenomena in low-dimensional materials have been attracting lots of attentions because of the heat dissipation problem in their nano-device applications. In this work, we prepared single-layer and double-layer WSe2 ultrathin films, and determined their cross-plane thermal resistance by using the time-domain thermoreflectance measurement technique. We observed that the thermal resistance of the double-layer film is fairly larger than that of the single-layer film, and discussed this intriguing difference by considering a contribution of the thermal boundary conductance at the interface of two WSe2 monolayers.