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ISSN Online: 2377-424X

ISBN CD: 1-56700-226-9

ISBN Online: 1-56700-225-0

International Heat Transfer Conference 13
August, 13-18, 2006, Sydney, Australia

THERMAL CONDUCTANCE OF TWO-SIDED CNT INTERFACES MEASUERED BY A PHOTO ACOUSTIC TECHNIQUE

Get access (open in a dialog) DOI: 10.1615/IHTC13.p21.90
10 pages

Resumo

This work describes an experimental study of thermal conductance across two-sided, multi-walled carbon nanotube (CNT) array interfaces. A photoacoustic technique is used to measure thermal interface resistance. Well anchored, dense and vertically oriented, multi-walled carbon nanotube arrays have been directly synthesized on silicon wafers and pure copper sheets using plasma-enhanced chemical vapor deposition. With the photoacoustic technique, the small interface resistance values of the highly conductive CNT-CNT interface can be measured with accuracy and precision. A comparison of present results with those from a 1-D reference bar method is presented along with discussion of experimental methods. The thermal contact resistance of the two-sided CNT interface is 4 ± 0.9 mm2K/W at moderate pressure and compares well with the resistance measured with the 1-D reference bar method.