Inscrição na biblioteca: Guest

ISSN Online: 2377-424X

ISBN Print: 0-89116-559-2

International Heat Transfer Conference 8
August, 17-22, 1986, San Francisco, USA

A STUDY OF TRANSPORT PHENOMENA IN THE INTERLINE REGION OF AN EVAPORATING THIN LIQUID FILM USING A SCANNING ELLIPSOMETER

Get access (open in a dialog) DOI: 10.1615/IHTC8.2590
pages 507-512

Resumo

The heat transfer characteristics in the leading edge region of a steady state evaporating ultra-thin film in the thickness range δ < 10−8 m were studied using a photoscanning ellipsometer. The unique design and use of a custom-made ellipsometer with a special heat transfer cell is discussed. Measurements of the concentration and thickness profiles are theoretically possible. The initial measurements of the thickness profile are analyzed using previously developed models based on the "disjoining pressure" concept to calculate the evaporative heat flux and the liquid-vapor interfacial heat transfer coefficient. The stability of the leading edge of a steady state evaporating thin film is demonstrated. The experimental results are consistent with past theoretical predictions based on the "disjoining pressure" concept.