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International Heat Transfer Conference 10

ISSN: 2377-424X (online)
ISSN: 2377-4371 (flashdrive)

MICROSCOPIC IMAGE PROCESSING SYSTEMS FOR MEASURING NONUNIFORM FILM THICKNESS PROFILES

A-H Liu
The Isermann Department of Chemical Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180-3590

Joel L. Plawsky
The Isermann Department of Chemical and Biological Engineering, Rensselaer Polytechnic Institute, USA

S. DasGupta
The Isermann Department of Chemical Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180-3590

Peter C. Wayner, Jr.
The Isermann Department of Chemical Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180-3590

DOI: 10.1615/IHTC10.3110
pages 267-272

要約

In very thin liquid films, transport processes are controlled by the temperature and the interfacial intermolecular force field which is a function of the film thickness profile and interfacial properties. The film thickness profile and interfacial properties can be measured most efficiently using a microscopic image processing system, IPS, to record the intensity pattern of the reflected light from the film. There are two types of IPS: an image analyzing interferometer (IAI) and/or an image scanning ellipsometer (ISE).
The ISE is a novel technique to measure the two dimensional thickness profile of a nonuniform, thin film, from I nm up to several µm, a steady state as well as in a transient state. It is a full field imaging technique which can study every point on the surface simultaneously with high spatial resolution and thickness sensitivity, i.e., it can measure and map the 2-D film thickness profile. Using the ISE, the transient thickness profile of a draining thin liquid film was measured and modeled. The interfacial conditions were determined in situ by measuring the Hamaker constant. The ISE and IAI systems are compared.

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