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ISSN Online: 2377-424X

ISBN CD: 1-56700-226-9

ISBN Online: 1-56700-225-0

International Heat Transfer Conference 13
August, 13-18, 2006, Sydney, Australia

MD INVESTIGATION OF INTERFACE EFFECT ON EFFECTIVE IN-PLANE THERMAL CONDUCTIVITY OF AR-LIKE NANO FILMS

Get access (open in a dialog) DOI: 10.1615/IHTC13.p8.90
9 pages

Sinopsis

Interface resistance is extremely important for composite nanostructures. The thermal contact resistance for perfect contact could be eliminated, however, the micro interface resistance originated from phonon mismatch plays a significant role in nanostructures. In fact the interface thermal resistance is not an intrinsic property of nanostructures. It depends on various factors including microstructure of interfaces. This work investigates the effect of staggered atom replacements across interfaces on the effective in-plane thermal conductivity of a dual-layered composite film and a monolayer film using molecular dynamics (MD). A new parameter, the staggered number density is defined which is the ratio of the number of staggered lattice sites across interface over the whole lattice sites in the interface plane. The effects of staggered number density and the height of the staggered sites are investigated. An interesting result is that the effective in-plane thermal conductivity varies with staggered number density non-monotonically. With increasing number density the conductivity first decreases and then increases. The thermal conductivity is found to decrease with increasing staggered height. Mechanism of these phenomena is discussed based on the phonon scattering theory.