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ISSN Online: 2377-424X

ISBN Print: 0-89116-559-2

International Heat Transfer Conference 8
August, 17-22, 1986, San Francisco, USA

MEASUREMENT OF TRANSIENT BEHAVIORS IN THERMAL RADIATION CHARACTERISTICS OF MATERIALS BY HIGH-SPEED SPECTROSCOPY

Get access (open in a dialog) DOI: 10.1615/IHTC8.2710
pages 577-582

Sinopsis

A high-speed spectrophotometer system is developed to investigate transient behaviors in thermal radiation characteristics of materials in industrial environments. The system allows measurements of various types of spectra of reflectance and emittance, in a wavelength region from 0.35 to 5.0 µm repeatedly within a period of 3 s. Transient behaviors in a specular and a diffuse reflectances are measured on copper oxidizing at high temperatures. An interference phenomenon due to multiple reflection at boundaries of the oxide films is found in the diffuse reflection spectrum of an oxidizing rough surface as well as in the specular reflection spectrum of an oxidizing optically-smooth surface. The mechanism of transition in radiation characteristics in the chemical reaction process is clarified by analyzing the behaviors.