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ISSN Online: 2377-424X

ISBN Print: 0-85295-345-3

International Heat Transfer Conference 10
August, 14-18, 1994, Brighton, UK

MICROSCOPIC IMAGE PROCESSING SYSTEMS FOR MEASURING NONUNIFORM FILM THICKNESS PROFILES

Get access (open in a dialog) DOI: 10.1615/IHTC10.3110
pages 267-272

摘要

In very thin liquid films, transport processes are controlled by the temperature and the interfacial intermolecular force field which is a function of the film thickness profile and interfacial properties. The film thickness profile and interfacial properties can be measured most efficiently using a microscopic image processing system, IPS, to record the intensity pattern of the reflected light from the film. There are two types of IPS: an image analyzing interferometer (IAI) and/or an image scanning ellipsometer (ISE).
The ISE is a novel technique to measure the two dimensional thickness profile of a nonuniform, thin film, from I nm up to several µm, a steady state as well as in a transient state. It is a full field imaging technique which can study every point on the surface simultaneously with high spatial resolution and thickness sensitivity, i.e., it can measure and map the 2-D film thickness profile. Using the ISE, the transient thickness profile of a draining thin liquid film was measured and modeled. The interfacial conditions were determined in situ by measuring the Hamaker constant. The ISE and IAI systems are compared.